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The effect of embedding a thin layer of a polymer on resistive switching characteristics for Au/CdSe/Au Structure
Ahmed Waled Kasim1, Haneafa Yahya Najm2, Omar Ghanim Ghazal3.
The phenomena of resistance random access memory (RRAM) depending on the altering of
resistance between at least two values has been found in materials such as transition metal
oxides, some semiconductors or insulators materials, named as resistive switching. The
developments on RRAM have been started due to its low power consumption, simple
structure, high-density, high – speed resistive switching, impressive retention with smallfeature size. Regardless of the wide-ranging research, basic switching conduction
mechanisms of the resistive memory structures are basically depending on the certain
special materials. To improve the current structure performance, the Cellulose Acetate as a
polymer was added to the active layer (cadmium selenide CdSe). The polymer material was
used to form the second active coating to construct the Au/CdSe/polymer/Au as new
structure. This material may enhance the cell performance by increasing the charges
traps. This procedure leads to increasing resistance ratio (Rratio) and decreasing the
working voltages of structure. A spin coating apparatus was used to coating the polymer
layer on CdSe. The glass was used as a substrate and the first active layer deposited under
vacuum by thermal evaporating system. The cell was sandwiched between the two
electrodes in the same materials (Au) which deposited also under the same system. Bipolar
resistive switch, in this memory structure, is observed in its switching operation. The zone
of the upper electrode (Au) has a significant affect upon the resistive performance. This
influence is became further in the big upper electrode zone (TEL=13.5mm2) where the
high-resistance (HRS) are inversely related to the upper electrode zone (A). This occurs
inducing more traps in case TEL (hanging sentence). Finally, the (Rratio) is directly
proportional with the electrode zone (A). The compliance current (Icc=30mA) are used for
protecting the structure from the damage. The current structure has many properties, such
as Vset = 3.9V, VReset = -1.9V and Rratio about 176 in case of TEL. We conclude from this
research that the embedment of a thin layer of a polymer which have been used in this
research are improving the high density, enhancing high speed with low cost as well
Affiliation:
- Northern Technical University, Iraq
- Northern Technical University, Iraq
- University of Mosul, Iraq
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Indexation |
Indexed by |
MyJurnal (2021) |
H-Index
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2 |
Immediacy Index
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0.000 |
Rank |
0 |
Indexed by |
Scopus 2020 |
Impact Factor
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CiteScore (1.3) |
Rank |
Q3 (Electrical and Electronic Engineering)) Q4 (Electronic, Optical and Magnetic Materials) |
Additional Information |
SJR (0.298) |
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