The Shewhart’s X chart has wide applications in the service and manufacturing sectors. The Shewhart’s X chart is effective for detecting large process mean shifts. On the other hand, both the Exponentially Weighted Moving Average (EWMA) and Cumulative Sum (CUSUM) control charts, introduced by Roberts (1959) and Page (1954), respectively, are used to detect small process mean shifts. Recently, many researchers have contributed to a wide variety of control charts to improve process monitoring, such as Costantino et al. (2015), Moraes et al. (2014), Ali and Riaz (2014), Haq et al. (2015), Chong et al. (2014), Teoh et al. (2014), Costa and Machado (2015) and many more. The Conforming Run Length (CRL) chart was proposed by Bourke in 1991. Bourke (1991) referred to CRL as the number of inspected units between two consecutive defective units. When CRL < LCRL, the CRL chart will indicate a shift in the process. Here, LCRL is the lower limit of the CRL chart.