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International Journal of Nanoelectronics and Materials
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International Journal of Nanoelectronics and Materials
Volume 2, No. 1, 2009
Al-Ani, S.K.J; Obaid, Y.N; Kasim, S.J; Mahdi, M.A.
Electrical and structural properties of flash evaporation InSb thin films
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1
Beloufa, Abbès; Bensaad, Zouaoui; Soudini, Bel-Abbes; Sekkal, Nadir; Bensaad, Abdelallah; Abid, Hamza.
First-principles calculations of the structural and electronic properties of AlN, GaN, InN, AlGaN and InGaN
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2
Bourezig, Y; Bouabdallah, B; Mansouri, S; Gaffiot, F.
Modelling of the film thickness effecton the carrier’s mobility in polysilicon thin film transistors
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3
Hashim, U; Chin, Seng Fatt; Sakrani, S.
Application of synopsys’ taurus TCAD in developing CMOS fabrication process modules
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4
Najim, Jassim M.
Studying the different effects of gamma and x-ray irradiation on the electrical properties of silicon diode type 1N1405
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5
Kifah Q. Salih; Ahmed, N.M.
Multilayer antireflection coatings model for red emission of silicon for optoelectronic applications
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6
Mansour, N.
Description of yrast states and deformation changes in tantalum nuclei (Ta)
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7
Benseddik, Nadia; Amrani, Mohammed; Benamara, Zineb; Mohammed- Brahim, Tayeb.
2D-Modelling for the simulation of current-voltage characteristics in polysilicon schottky diode deposited by LPCVD and SAPCVD methods
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8
Oke, S.A; Oyekunle, A.A; Salau, T.A.O; Adegbemile, A.A; Lawal, K.O.
Estimation of thermal contact resistance in metal-plastic interface of semiconducting electronic devices
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9
Sehil, M; Abid, H; Lachebi, A; Al-Douri, Y.
Electronic and positronic studies of zinc-blend boron phosphide BP underpressure
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10
Uda Hashim; Elley Nadia; Shahrir Salleh.
Nanotechnology development status in Malaysia: industrialization strategy and practices
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11
Journal Coverage
Volume 17, No. 4, Okt 2024
Volume 17, No. 3, July 2024
Volume 17, No. 2, April 2024
Volume 17, No. 1, Jan 2024
Volume 16, No. 101, Special Issue Dec 2023
Volume 16, No. 4, Okt 2023
Volume 16, No. 3, Julai 2023
Volume 16, No. 2, Apr 2023
Volume 16, No. 1, Jan 2023
Volume 15, No.101, Special Issue March 2022
Volume 15, No. 101, Special Issue Dec 2022
Volume 15, No. 4, Oct 2022
Volume 15, No. 3, July 2022
Volume 15, No. 2, April 2022
Volume 15, No. 1, January 2022
Volume 14, December 2021 (Special Issue INCAPE 2021)
Volume 14, August 2021 ( Special Issue ISSTE 2021)
Volume 14, No. 4, October 2021
Volume 14, No. 3, July 2021
Volume 14, No. 2, April 2021
Volume 14, No. 1, January 2021
Volume 13, Special Issue, December 2020
Volume 13, Special Issue, Mei 2020
Volume 13, No. 4, October 2020
Volume 13, No. 3, July 2020
Volume 13, No. 2, Apr 2020
Volume 13, No. 1, Jan 2020
Volume 12, No. 4, Oct 2019
Volume 12, No. 3, July 2019
Volume 12, No.2, April 2019
Volume 12, No.1, January 2019
Volume 11, December 2018 (Special Issue BOND21)
Volume 11, November 2018 (Special Issue ICOBE)
Volume 11, No. 4, October 2018
Volume 11, No. 3, Juy 2018
Volume 11, No. 2, April 2018
Volume 11, No. 1, January 2018
Volume 10, No. 2, 2017
Volume 10, No. 1, 2017
Volume 9, No. 2, 2016
Volume 9, No. 1, 2016
Volume 8, No. 2, 2015
Volume 8, No. 1, 2015
Volume 6, No. 2, 2013
Volume 6, No. 1, 2013
Volume 5, No. 2, 2012
Volume 5, No. 1, 2012
Volume 4, No. 2, 2011
Volume 4, No. 1, 2011
Volume 3, No. 2, 2010
Volume 3, No. 1, 2010
Volume 2, No. 2, 2009
Volume 2, No. 1, 2009
Volume 1, No. 1, 2008
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H-Index
2
Immediacy Index
0.000
Rank
0
Indexed by
Scopus 2020
Impact Factor
CiteScore (1.3)
Rank
Q3 (Electrical and Electronic Engineering))
Q4 (Electronic, Optical and Magnetic Materials)
Additional Information
SJR (0.298)
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